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Parallel and Statistical Analysis and Modeling of Nanometer VLSI Systems

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Author :
Release : 2013
Genre : Electronic circuit design
Kind : eBook
Book Rating : /5 ( reviews)

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Book Synopsis Parallel and Statistical Analysis and Modeling of Nanometer VLSI Systems by : Xue-Xin Liu

Download or read book Parallel and Statistical Analysis and Modeling of Nanometer VLSI Systems written by Xue-Xin Liu. This book was released on 2013. Available in PDF, EPUB and Kindle. Book excerpt:

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

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Author :
Release : 2014-07-08
Genre : Technology & Engineering
Kind : eBook
Book Rating : 885/5 ( reviews)

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Book Synopsis Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs by : Ruijing Shen

Download or read book Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs written by Ruijing Shen. This book was released on 2014-07-08. Available in PDF, EPUB and Kindle. Book excerpt: Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips. This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.

Advanced Symbolic Analysis for VLSI Systems

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Release : 2014-06-19
Genre : Technology & Engineering
Kind : eBook
Book Rating : 031/5 ( reviews)

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Book Synopsis Advanced Symbolic Analysis for VLSI Systems by : Guoyong Shi

Download or read book Advanced Symbolic Analysis for VLSI Systems written by Guoyong Shi. This book was released on 2014-06-19. Available in PDF, EPUB and Kindle. Book excerpt: This book provides comprehensive coverage of the recent advances in symbolic analysis techniques for design automation of nanometer VLSI systems. The presentation is organized in parts of fundamentals, basic implementation methods and applications for VLSI design. Topics emphasized include statistical timing and crosstalk analysis, statistical and parallel analysis, performance bound analysis and behavioral modeling for analog integrated circuits. Among the recent advances, the Binary Decision Diagram (BDD) based approaches are studied in depth. The BDD-based hierarchical symbolic analysis approaches, have essentially broken the analog circuit size barrier.

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

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Author :
Release : 2012-03-21
Genre :
Kind : eBook
Book Rating : 898/5 ( reviews)

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Book Synopsis Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs by :

Download or read book Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs written by . This book was released on 2012-03-21. Available in PDF, EPUB and Kindle. Book excerpt:

Long-Term Reliability of Nanometer VLSI Systems

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Author :
Release : 2019-09-12
Genre : Technology & Engineering
Kind : eBook
Book Rating : 727/5 ( reviews)

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Book Synopsis Long-Term Reliability of Nanometer VLSI Systems by : Sheldon Tan

Download or read book Long-Term Reliability of Nanometer VLSI Systems written by Sheldon Tan. This book was released on 2019-09-12. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques. Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models; Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects; Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels; Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.

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