1# Library to Find Best eBook for Read
Author :
Release : 2012-03-21
Genre :
Kind : eBook
Book Rating : 898/5 ( reviews)
Book Synopsis Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs by :
Download or read book Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs written by . This book was released on 2012-03-21. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Ruijing Shen
Release : 2014-07-08
Genre : Technology & Engineering
Kind : eBook
Book Rating : 885/5 ( reviews)
Book Synopsis Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs by : Ruijing Shen
Download or read book Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs written by Ruijing Shen. This book was released on 2014-07-08. Available in PDF, EPUB and Kindle. Book excerpt: Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips. This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.
Author : Wenjian Yu
Release : 2014-04-21
Genre : Technology & Engineering
Kind : eBook
Book Rating : 980/5 ( reviews)
Book Synopsis Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits by : Wenjian Yu
Download or read book Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits written by Wenjian Yu. This book was released on 2014-04-21. Available in PDF, EPUB and Kindle. Book excerpt: Resistance and capacitance (RC) extraction is an essential step in modeling the interconnection wires and substrate coupling effect in nanometer-technology integrated circuits (IC). The field-solver techniques for RC extraction guarantee the accuracy of modeling, and are becoming increasingly important in meeting the demand for accurate modeling and simulation of VLSI designs. Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits presents a systematic introduction to, and treatment of, the key field-solver methods for RC extraction of VLSI interconnects and substrate coupling in mixed-signal ICs. Various field-solver techniques are explained in detail, with real-world examples to illustrate the advantages and disadvantages of each algorithm. This book will benefit graduate students and researchers in the field of electrical and computer engineering as well as engineers working in the IC design and design automation industries. Dr. Wenjian Yu is an Associate Professor at the Department of Computer Science and Technology at Tsinghua University in China; Dr. Xiren Wang is a R&D Engineer at Cadence Design Systems in the USA.
Author : Xue-Xin Liu
Release : 2013
Genre : Electronic circuit design
Kind : eBook
Book Rating : 454/5 ( reviews)
Book Synopsis Parallel and Statistical Analysis and Modeling of Nanometer VLSI Systems by : Xue-Xin Liu
Download or read book Parallel and Statistical Analysis and Modeling of Nanometer VLSI Systems written by Xue-Xin Liu. This book was released on 2013. Available in PDF, EPUB and Kindle. Book excerpt: Electronic design automation (EDA) is an important part of the integrated circuit (IC) industry, and has been evolving together with design and fabrication technologies. This evolution is reflected in both algorithm perspective and software implementation perspective. Innovative algorithms delivers accurate and reliable results in shorter computation time, and thus saves human resource and R&D cost. Smartly designed software can utilize hardware resources efficiently and maximize computing performance.
Author : Guoyong Shi
Release : 2014-06-19
Genre : Technology & Engineering
Kind : eBook
Book Rating : 031/5 ( reviews)
Book Synopsis Advanced Symbolic Analysis for VLSI Systems by : Guoyong Shi
Download or read book Advanced Symbolic Analysis for VLSI Systems written by Guoyong Shi. This book was released on 2014-06-19. Available in PDF, EPUB and Kindle. Book excerpt: This book provides comprehensive coverage of the recent advances in symbolic analysis techniques for design automation of nanometer VLSI systems. The presentation is organized in parts of fundamentals, basic implementation methods and applications for VLSI design. Topics emphasized include statistical timing and crosstalk analysis, statistical and parallel analysis, performance bound analysis and behavioral modeling for analog integrated circuits. Among the recent advances, the Binary Decision Diagram (BDD) based approaches are studied in depth. The BDD-based hierarchical symbolic analysis approaches, have essentially broken the analog circuit size barrier.
