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Long-Term Reliability of Nanometer VLSI Systems

2019-09-12 Technology & Engineering
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Release : 2019-09-12
Genre : Technology & Engineering
Kind : eBook
Book Rating : 727/5 ( reviews)

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Book Synopsis Long-Term Reliability of Nanometer VLSI Systems by : Sheldon Tan

Download or read book Long-Term Reliability of Nanometer VLSI Systems written by Sheldon Tan. This book was released on 2019-09-12. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques. Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models; Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects; Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels; Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.

Research in VLSI Reliability

1986
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Release : 1986
Genre :
Kind : eBook
Book Rating : /5 ( reviews)

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Book Synopsis Research in VLSI Reliability by : Chenming Hu

Download or read book Research in VLSI Reliability written by Chenming Hu. This book was released on 1986. Available in PDF, EPUB and Kindle. Book excerpt: In order to increase the circuit density and speed of VLSI systems, microelectronic device geometry is shrinking from a few microns to submicron and beyond. This scaling has greatly heightened the need for a better understanding of the failure mechanisms affecting the long-term reliability of VLSI system and for improved methods of designing and testing for reliability. In contrast to production technologies and circuit performances, whose failures to meet specifications will be either obvious or relatively easily discovered before the circuits are incorporated into complex systems or missions, reliability failures cannot be easily or completely eliminated. When they do occur, reliability failures can be costly in many ways. The objective of this research is to gain basic scientific understanding of the mechanisms of the three leading hard failure modes: oxide wearout, hot-electron-induced degradations, and contact and metal failures. the basic understanding should lead to failure models and methods to improve reliability assurance through design, processing, and testing techniques. (Author).

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

2014-07-08 Technology & Engineering
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Release : 2014-07-08
Genre : Technology & Engineering
Kind : eBook
Book Rating : 885/5 ( reviews)

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Book Synopsis Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs by : Ruijing Shen

Download or read book Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs written by Ruijing Shen. This book was released on 2014-07-08. Available in PDF, EPUB and Kindle. Book excerpt: Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips. This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.

Hot-Carrier Reliability of MOS VLSI Circuits

2012-12-06 Technology & Engineering
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Release : 2012-12-06
Genre : Technology & Engineering
Kind : eBook
Book Rating : 507/5 ( reviews)

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Book Synopsis Hot-Carrier Reliability of MOS VLSI Circuits by : Yusuf Leblebici

Download or read book Hot-Carrier Reliability of MOS VLSI Circuits written by Yusuf Leblebici. This book was released on 2012-12-06. Available in PDF, EPUB and Kindle. Book excerpt: As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be based on both the failure mode analysis and the basic understanding of the physical failure mechanisms observed in integrated circuits. Hot-carrier induced degrada tion of MOS transistor characteristics is one of the primary mechanisms affecting the long-term reliability of MOS VLSI circuits. It is likely to become even more important in future generation chips, since the down ward scaling of transistor dimensions without proportional scaling of the operating voltage aggravates this problem. A thorough understanding of the physical mechanisms leading to hot-carrier related degradation of MOS transistors is a prerequisite for accurate circuit reliability evaluation. It is also being recognized that important reliability concerns other than the post-manufacture reliability qualification need to be addressed rigorously early in the design phase. The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits. If the predicted reliability does not satisfy the requirements, appropriate design modifications may be carried out to improve the resistance of the devices to degradation.

Circuit Design for Reliability

2014-11-08 Technology & Engineering
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Release : 2014-11-08
Genre : Technology & Engineering
Kind : eBook
Book Rating : 785/5 ( reviews)

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Book Synopsis Circuit Design for Reliability by : Ricardo Reis

Download or read book Circuit Design for Reliability written by Ricardo Reis. This book was released on 2014-11-08. Available in PDF, EPUB and Kindle. Book excerpt: This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

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