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Self-Checking and Fault-Tolerant Digital Design

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Author :
Release : 2001
Genre : Computers
Kind : eBook
Book Rating : 702/5 ( reviews)

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Book Synopsis Self-Checking and Fault-Tolerant Digital Design by : Parag K. Lala

Download or read book Self-Checking and Fault-Tolerant Digital Design written by Parag K. Lala. This book was released on 2001. Available in PDF, EPUB and Kindle. Book excerpt: With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical applications relying on faster, more powerful chips, fault-tolerant, self-checking mechanisms must be built in to assure reliable operation. Self-Checking and Fault-Tolerant Digital Design deals extensively with self-checking design techniques and is the only book that emphasizes major techniques for hardware fault tolerance. Graduate students in VLSI design courses as well as practicing designers will appreciate this balanced treatment of the concepts and theory underlying fault tolerance along with the practical techniques used to create fault-tolerant systems. Features: Introduces reliability theory and the importance of maintainability Presents coding and the construction of several error detecting and correcting codes Discusses in depth, the available techniques for fail-safe design of combinational circuits Details checker design techniques for detecting erroneous bits and encoding output of self-checking circuits Demonstrates how to design self-checking sequential circuits, including a technique for fail-safe state machine design

Practical Digital Logic Design and Testing

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Author :
Release : 1996
Genre : Computers
Kind : eBook
Book Rating : /5 ( reviews)

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Book Synopsis Practical Digital Logic Design and Testing by : Parag K. Lala

Download or read book Practical Digital Logic Design and Testing written by Parag K. Lala. This book was released on 1996. Available in PDF, EPUB and Kindle. Book excerpt: This text presents the essentials of modern logic design. The author conveys key concepts in a clear, informal manner, demonstrating theory through numerous examples to establish a theoretical basis for practical applications. All major topics, including PLD-based digital design, are covered, and detailed coverage of digital logic circuit testing methods critical to successful chip manufacturing, are included. The industry standard PLD programming language ABEL is fully integrated where appropriate. The work also includes coverage of test generation techniques and design methods for testability, a complete discussion of PLD (Programmable Logic Device) based digital design, and coverage of state assignment and minimization explained using computer aided techniques.

Design and Analysis of Fault-tolerant Digital Systems

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Author :
Release : 1989
Genre : Fault-tolerant computing
Kind : eBook
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Book Synopsis Design and Analysis of Fault-tolerant Digital Systems by : Barry W. Johnson

Download or read book Design and Analysis of Fault-tolerant Digital Systems written by Barry W. Johnson. This book was released on 1989. Available in PDF, EPUB and Kindle. Book excerpt:

Fault Tolerant and Fault Testable Hardware Design

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Author :
Release : 1985
Genre : Computers
Kind : eBook
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Book Synopsis Fault Tolerant and Fault Testable Hardware Design by : Parag K. Lala

Download or read book Fault Tolerant and Fault Testable Hardware Design written by Parag K. Lala. This book was released on 1985. Available in PDF, EPUB and Kindle. Book excerpt:

Testing and Reliable Design of CMOS Circuits

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Release : 2012-12-06
Genre : Computers
Kind : eBook
Book Rating : 255/5 ( reviews)

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Book Synopsis Testing and Reliable Design of CMOS Circuits by : Niraj K. Jha

Download or read book Testing and Reliable Design of CMOS Circuits written by Niraj K. Jha. This book was released on 2012-12-06. Available in PDF, EPUB and Kindle. Book excerpt: In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved testability have been presented. These design for testability techniques have begun to catch the attention of chip manufacturers. The trend is towards placing increased emphasis on these techniques. Another byproduct of the increase in the complexity of chips is their higher susceptibility to faults. In order to take care of this problem, we need to build fault-tolerant systems. The area of fault-tolerant computing has steadily gained in importance. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing. Due to the impor tance of CMOS technology, a significant portion of these courses may be devoted to CMOS testing. This book has been written as a reference text for such courses offered at the senior or graduate level. Familiarity with logic design and switching theory is assumed. The book should also prove to be useful to professionals working in the semiconductor industry.

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