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Testing and Reliable Design of CMOS Circuits

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Release : 2012-12-06
Genre : Computers
Kind : eBook
Book Rating : 255/5 ( reviews)

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Book Synopsis Testing and Reliable Design of CMOS Circuits by : Niraj K. Jha

Download or read book Testing and Reliable Design of CMOS Circuits written by Niraj K. Jha. This book was released on 2012-12-06. Available in PDF, EPUB and Kindle. Book excerpt: In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved testability have been presented. These design for testability techniques have begun to catch the attention of chip manufacturers. The trend is towards placing increased emphasis on these techniques. Another byproduct of the increase in the complexity of chips is their higher susceptibility to faults. In order to take care of this problem, we need to build fault-tolerant systems. The area of fault-tolerant computing has steadily gained in importance. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing. Due to the impor tance of CMOS technology, a significant portion of these courses may be devoted to CMOS testing. This book has been written as a reference text for such courses offered at the senior or graduate level. Familiarity with logic design and switching theory is assumed. The book should also prove to be useful to professionals working in the semiconductor industry.

CMOS

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Release : 2008
Genre : Technology & Engineering
Kind : eBook
Book Rating : 411/5 ( reviews)

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Book Synopsis CMOS by : R. Jacob Baker

Download or read book CMOS written by R. Jacob Baker. This book was released on 2008. Available in PDF, EPUB and Kindle. Book excerpt: This edition provides an important contemporary view of a wide range of analog/digital circuit blocks, the BSIM model, data converter architectures, and more. The authors develop design techniques for both long- and short-channel CMOS technologies and then compare the two.

CMOS Logic Circuit Design

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Release : 2007-05-08
Genre : Technology & Engineering
Kind : eBook
Book Rating : 294/5 ( reviews)

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Book Synopsis CMOS Logic Circuit Design by : John P. Uyemura

Download or read book CMOS Logic Circuit Design written by John P. Uyemura. This book was released on 2007-05-08. Available in PDF, EPUB and Kindle. Book excerpt: This is an up-to-date treatment of the analysis and design of CMOS integrated digital logic circuits. The self-contained book covers all of the important digital circuit design styles found in modern CMOS chips, emphasizing solving design problems using the various logic styles available in CMOS.

On Reliable Design of CMOS Circuits

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Author :
Release : 1992
Genre : Electrical engineering
Kind : eBook
Book Rating : /5 ( reviews)

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Book Synopsis On Reliable Design of CMOS Circuits by : Sivaramakrishnan Subramanian

Download or read book On Reliable Design of CMOS Circuits written by Sivaramakrishnan Subramanian. This book was released on 1992. Available in PDF, EPUB and Kindle. Book excerpt: Techniques for hierarchical design of self-checking CMOS VLSIcircuits and BIST implementation for sequential VLSI circuits are presented.

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

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Release : 2017-12-19
Genre : Technology & Engineering
Kind : eBook
Book Rating : 42X/5 ( reviews)

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Book Synopsis Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits by : Sandeep K. Goel

Download or read book Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits written by Sandeep K. Goel. This book was released on 2017-12-19. Available in PDF, EPUB and Kindle. Book excerpt: Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause immediate timing failures on both critical and non-critical paths in the circuit. Overviews semiconductor industry test challenges and the need for SDD testing, including basic concepts and introductory material Describes algorithmic solutions incorporated in commercial tools from Mentor Graphics Reviews SDD testing based on "alternative methods" that explores new metrics, top-off ATPG, and circuit topology-based solutions Highlights the advantages and disadvantages of a diverse set of metrics, and identifies scope for improvement Written from the triple viewpoint of university researchers, EDA tool developers, and chip designers and tool users, this book is the first of its kind to address all aspects of SDD testing from such a diverse perspective. The book is designed as a one-stop reference for current industrial practices, research challenges in the domain of SDD testing, and recent developments in SDD solutions.

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