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Author : Martyn Simon Davies
Release : 1992
Genre : Integrated circuits
Kind : eBook
Book Rating : /5 ( reviews)
Book Synopsis Reliability in Very Large Scale Integrated Circuits by : Martyn Simon Davies
Download or read book Reliability in Very Large Scale Integrated Circuits written by Martyn Simon Davies. This book was released on 1992. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Michael James Satterfield
Release : 1987
Genre :
Kind : eBook
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Book Synopsis A Nonstatistical Approach to the Reliability Assessment of Very Large Scale Integrated Circuits by : Michael James Satterfield
Download or read book A Nonstatistical Approach to the Reliability Assessment of Very Large Scale Integrated Circuits written by Michael James Satterfield. This book was released on 1987. Available in PDF, EPUB and Kindle. Book excerpt:
Author : D. Coit
Release : 1984
Genre :
Kind : eBook
Book Rating : /5 ( reviews)
Book Synopsis VLSI (Very Large Scale Integrated Circuits) Device Reliability Models by : D. Coit
Download or read book VLSI (Very Large Scale Integrated Circuits) Device Reliability Models written by D. Coit. This book was released on 1984. Available in PDF, EPUB and Kindle. Book excerpt: This report details a study in which the objective was to develop failure rate prediction models for VLSI, Hybrid, analog microprocessor, and VHSIC devices. A description is given of the various phases involved in reliability prediction model development, such as; literature collection/review, investigation of failure modes, failure rate data collection, statistical analysis methodologies, model factors quantification, and model validation. For VLSI, Hybrid and analog microprocessor devices, the models are given in a form which can easily be included in MIL-HDBK-217. For VHSIC devices, this effort was necessarily limited to the identification of necessary model factors (attributes) which should be included in a quantitative model acceptable for inclusion in MIL-HDBK-217. This effort was necessarily limited to the development of a qualitative reliability prediction model due to the lack of available data on VHSIC devices at the time of this study. Keywords include: VLSI, Hybrid microcircuit, Integrated circuit, Failure rate, MIL-HDBK-217, and Reliability prediction.
Author : A.P. Dorey
Release : 2012-12-06
Genre : Technology & Engineering
Kind : eBook
Book Rating : 87X/5 ( reviews)
Book Synopsis Rapid Reliability Assessment of VLSICs by : A.P. Dorey
Download or read book Rapid Reliability Assessment of VLSICs written by A.P. Dorey. This book was released on 2012-12-06. Available in PDF, EPUB and Kindle. Book excerpt: The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service. One possible approach that is described in this book is to make precise electrical measurements that may reveal those devices more likely to fail. The measurements assessed are of analog circuit parameters which, based on a knowledge of failure mechanisms, may indicate a future failure. . To incorporate these tests into the functional listing of very large scale integrated circuits consideration has to be given to the sensitivity of the tests where small numbers of devices may be defective in a complex circuit. In addition the tests ideally should require minimal extra test time. A range of tests has been evaluated and compared with simulation used to assess the sensitivity of the measurements. Other work in the field is fully referenced at the end of each chapter. The team at Lancaster responsible for this book wish to thank the Alvey directorate and SERe for the necessary support and encouragement to publish our results. We would also like to thank John Henderson, recently retired from the British Telecom Research Laboratories, for his cheerful and enthusiastic encouragement. Trevor Ingham, now in New Zealand, is thanked for his early work on the project.
Author : Mohsen Raji
Release : 2022-11-16
Genre : Technology & Engineering
Kind : eBook
Book Rating : 456/5 ( reviews)
Book Synopsis Lifetime Reliability-aware Design of Integrated Circuits by : Mohsen Raji
Download or read book Lifetime Reliability-aware Design of Integrated Circuits written by Mohsen Raji. This book was released on 2022-11-16. Available in PDF, EPUB and Kindle. Book excerpt: This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
