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Optical Characterization of Thin Solid Films

2018-03-09 Science
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Release : 2018-03-09
Genre : Science
Kind : eBook
Book Rating : 258/5 ( reviews)

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Book Synopsis Optical Characterization of Thin Solid Films by : Olaf Stenzel

Download or read book Optical Characterization of Thin Solid Films written by Olaf Stenzel. This book was released on 2018-03-09. Available in PDF, EPUB and Kindle. Book excerpt: This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.

Optical Properties of Thin Solid Films

1991-01-01 Science
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Release : 1991-01-01
Genre : Science
Kind : eBook
Book Rating : 246/5 ( reviews)

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Book Synopsis Optical Properties of Thin Solid Films by : O. S. Heavens

Download or read book Optical Properties of Thin Solid Films written by O. S. Heavens. This book was released on 1991-01-01. Available in PDF, EPUB and Kindle. Book excerpt: Authoritative reference treats the formation, structure, optical properties, and uses of thin solid films, emphasizing causes of their unusual qualities. 162 figures. 19 tables. 1955 edition.

Spectroscopic Ellipsometry

2007-09-27 Technology & Engineering
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Release : 2007-09-27
Genre : Technology & Engineering
Kind : eBook
Book Rating : 186/5 ( reviews)

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Book Synopsis Spectroscopic Ellipsometry by : Hiroyuki Fujiwara

Download or read book Spectroscopic Ellipsometry written by Hiroyuki Fujiwara. This book was released on 2007-09-27. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.

Optical Characterization of Real Surfaces and Films

2013-10-22 Science
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Release : 2013-10-22
Genre : Science
Kind : eBook
Book Rating : 935/5 ( reviews)

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Book Synopsis Optical Characterization of Real Surfaces and Films by : K. Vedam

Download or read book Optical Characterization of Real Surfaces and Films written by K. Vedam. This book was released on 2013-10-22. Available in PDF, EPUB and Kindle. Book excerpt: This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.

Handbook of Optical Properties

1995-02-24 Science
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Release : 1995-02-24
Genre : Science
Kind : eBook
Book Rating : 840/5 ( reviews)

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Book Synopsis Handbook of Optical Properties by : Rolf E. Hummel

Download or read book Handbook of Optical Properties written by Rolf E. Hummel. This book was released on 1995-02-24. Available in PDF, EPUB and Kindle. Book excerpt: Thin Films for Optical Coating emphasizes the applications of thin films, deposition of thin films, and thin film characterization. Unlike monographs on this subject, this book presents the views of many expert authors. Individual chapters span a wide arc of topics within this field of study. The book offers an introduction to usual and unusual applications of optical thin films, treating in a more qualitative way general topics such as anticounterfeiting coatings, decorative coatings, light switches, contrast enhancement coatings, multiplexers, optical memories, and more. Contributors review thin film media for optical data storage, UV broadband and narrow-band filters, and optically active thin film coatings. Ion beam sputtering and magnetron sputtering deposition methods are described in detail. Characterization techniques are provided, including Raman spectroscopy and absorption measurements. The book also offers theories on light scattering of thin dielectric films and the electromagnetic properties of nanocermet thin films. This reference incorporates recent research by the individual authors with their views of current developments in their respective fields. Of particular interest to the reader will be an assessment of the historical developments of thin film physics written by one of the fathers of thin film technology, Professor M. Auwärter.

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