Share

Low-Power Variation-Tolerant Design in Nanometer Silicon

2014-10-10 Technology & Engineering
Download Low-Power Variation-Tolerant Design in Nanometer Silicon PDF Online Free

Author :
Release : 2014-10-10
Genre : Technology & Engineering
Kind : eBook
Book Rating : 578/5 ( reviews)

GET EBOOK


Book Synopsis Low-Power Variation-Tolerant Design in Nanometer Silicon by : Swarup Bhunia

Download or read book Low-Power Variation-Tolerant Design in Nanometer Silicon written by Swarup Bhunia. This book was released on 2014-10-10. Available in PDF, EPUB and Kindle. Book excerpt: Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.

Low-Power Variation-Tolerant Design in Nanometer Silicon

2010-11-10 Technology & Engineering
Download Low-Power Variation-Tolerant Design in Nanometer Silicon PDF Online Free

Author :
Release : 2010-11-10
Genre : Technology & Engineering
Kind : eBook
Book Rating : 180/5 ( reviews)

GET EBOOK


Book Synopsis Low-Power Variation-Tolerant Design in Nanometer Silicon by : Swarup Bhunia

Download or read book Low-Power Variation-Tolerant Design in Nanometer Silicon written by Swarup Bhunia. This book was released on 2010-11-10. Available in PDF, EPUB and Kindle. Book excerpt: Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.

Hardware Accelerators in Data Centers

2018-08-21 Technology & Engineering
Download Hardware Accelerators in Data Centers PDF Online Free

Author :
Release : 2018-08-21
Genre : Technology & Engineering
Kind : eBook
Book Rating : 922/5 ( reviews)

GET EBOOK


Book Synopsis Hardware Accelerators in Data Centers by : Christoforos Kachris

Download or read book Hardware Accelerators in Data Centers written by Christoforos Kachris. This book was released on 2018-08-21. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with an overview of the architectures, programming frameworks, and hardware accelerators for typical cloud computing applications in data centers. The authors present the most recent and promising solutions, using hardware accelerators to provide high throughput, reduced latency and higher energy efficiency compared to current servers based on commodity processors. Readers will benefit from state-of-the-art information regarding application requirements in contemporary data centers, computational complexity of typical tasks in cloud computing, and a programming framework for the efficient utilization of the hardware accelerators.

Timing Performance of Nanometer Digital Circuits Under Process Variations

2018-04-18 Technology & Engineering
Download Timing Performance of Nanometer Digital Circuits Under Process Variations PDF Online Free

Author :
Release : 2018-04-18
Genre : Technology & Engineering
Kind : eBook
Book Rating : 653/5 ( reviews)

GET EBOOK


Book Synopsis Timing Performance of Nanometer Digital Circuits Under Process Variations by : Victor Champac

Download or read book Timing Performance of Nanometer Digital Circuits Under Process Variations written by Victor Champac. This book was released on 2018-04-18. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications. Various circuit-level “design hints” are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.

Design of Variation-tolerant Circuits for Nanometer CMOS Technology

2008
Download Design of Variation-tolerant Circuits for Nanometer CMOS Technology PDF Online Free

Author :
Release : 2008
Genre :
Kind : eBook
Book Rating : /5 ( reviews)

GET EBOOK


Book Synopsis Design of Variation-tolerant Circuits for Nanometer CMOS Technology by : Mohamed Hassan Abu-Rahma

Download or read book Design of Variation-tolerant Circuits for Nanometer CMOS Technology written by Mohamed Hassan Abu-Rahma. This book was released on 2008. Available in PDF, EPUB and Kindle. Book excerpt: Aggressive scaling of CMOS technology in sub-90nm nodes has created huge challenges. Variations due to fundamental physical limits, such as random dopants fluctuation (RDF) and line edge roughness (LER) are increasing significantly with technology scaling. In addition, manufacturing tolerances in process technology are not scaling at the same pace as transistor's channel length due to process control limitations (e.g., sub-wavelength lithography). Therefore, within-die process variations worsen with successive technology generations. These variations have a strong impact on the maximum clock frequency and leakage power for any digital circuit, and can also result in functional yield losses in variation-sensitive digital circuits (such as SRAM). Moreover, in nanometer technologies, digital circuits show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost while achieving higher performance and density. It is therefore not surprising that the International Technology Roadmap for Semiconductors (ITRS) lists variability as one of the most challenging obstacles for IC design in nanometer regime. To facilitate variation-tolerant design, we study the impact of random variations on the delay variability of a logic gate and derive simple and scalable statistical models to evaluate delay variations in the presence of within-die variations. This work provides new design insight and highlights the importance of accounting for the effect of input slew on delay variations, especially at lower supply voltages.

You may also like...