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Integrated Circuit Quality and Reliability

1987 Technology & Engineering
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Release : 1987
Genre : Technology & Engineering
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Book Synopsis Integrated Circuit Quality and Reliability by : Eugene R. Hnatek

Download or read book Integrated Circuit Quality and Reliability written by Eugene R. Hnatek. This book was released on 1987. Available in PDF, EPUB and Kindle. Book excerpt: Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.

Integrated Circuit Quality and Reliability

2018-10-03 Technology & Engineering
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Release : 2018-10-03
Genre : Technology & Engineering
Kind : eBook
Book Rating : 719/5 ( reviews)

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Book Synopsis Integrated Circuit Quality and Reliability by : Eugene R. Hnatek

Download or read book Integrated Circuit Quality and Reliability written by Eugene R. Hnatek. This book was released on 2018-10-03. Available in PDF, EPUB and Kindle. Book excerpt: Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.

Techniques for the Control of Integrated Circuit Quality and Reliability Volume Ii - Appendices

1967
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Release : 1967
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Book Synopsis Techniques for the Control of Integrated Circuit Quality and Reliability Volume Ii - Appendices by : Erwin A. Herr

Download or read book Techniques for the Control of Integrated Circuit Quality and Reliability Volume Ii - Appendices written by Erwin A. Herr. This book was released on 1967. Available in PDF, EPUB and Kindle. Book excerpt: This is a program directed to establish techniques for the control of integrated circuit quality and reliability. The primary objective of this program was to investigate a method to monitor integrated circuit fabrication which would provide information about the quality and reliability of the device. The use of the test pattern concept, TEG, for in-process quality control and device reliability of integrated circuits was investigated during the fabrication and reliability testing phases of integrated circuit production. The Test Element Group (TEG), which was diffused on the wafer at the same time as the elements of the integrated circuit, proved to be a very successful vehicle for achieving the goals of this program. The TEG was made up of a number of selected elements in the integrated circuit diffusion pattern, metallized and connected for test evaluation as discrete components. The relationship was investigated between in-process variables of semiconductor fabrication, pre-stress characteristics of TEGS and integrated circuits and the post-stress characteristics of TEGS and integrated circuits.

Techniques for the Control of Integrated Circuit Quality and Reliability

1967
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Release : 1967
Genre :
Kind : eBook
Book Rating : /5 ( reviews)

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Book Synopsis Techniques for the Control of Integrated Circuit Quality and Reliability by : Erwin A. Herr

Download or read book Techniques for the Control of Integrated Circuit Quality and Reliability written by Erwin A. Herr. This book was released on 1967. Available in PDF, EPUB and Kindle. Book excerpt: The use of the test pattern concept, TEG, for in-process quality control and device reliability of integrated circuits was investigated during the fabrication and reliability testing phases of integrated circuit production. The Test Element Group (TEG), which was diffused on the wafer at the same time as the elements of the integrated circuit, proved to be a very successful vehicle for achieving the goals of this program. The TEG was made up of a number of selected elements in the integrated circuit diffusion pattern, metallized and connected for test evaluation as discrete components. The relationship was investigated between in-process variables of semi-conductor fabrication, pre-stress characteristics of TEGS and integrated circuits and the post-stress characteristics of TEGS and integrated circuits. The basic purpose of this program has been met.

Integrated Circuit Failure Analysis

1998-02-04 Technology & Engineering
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Release : 1998-02-04
Genre : Technology & Engineering
Kind : eBook
Book Rating : 017/5 ( reviews)

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Book Synopsis Integrated Circuit Failure Analysis by : Friedrich Beck

Download or read book Integrated Circuit Failure Analysis written by Friedrich Beck. This book was released on 1998-02-04. Available in PDF, EPUB and Kindle. Book excerpt: Funktionstests an integrierten Schaltungen sind für deren Zuverlässigkeit von herausragender Bedeutung. Erstmals werden in diesem Werk die speziellen Präparationstechniken für die Fehleranalyse beschrieben. Ausgehend von den theoretischen Grundlagen erläutert der Autor in praxisnahem Stil die verschiedenen Techniken, die das Zurückverfolgen von Ausfällen ermöglichen.

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