1# Library to Find Best eBook for Read
Author : Eugene R. Hnatek
Release : 1993-08-31
Genre : Technology & Engineering
Kind : eBook
Book Rating : 438/5 ( reviews)
Book Synopsis Digital Integrated Circuit Testing from a Quality Perspective by : Eugene R. Hnatek
Download or read book Digital Integrated Circuit Testing from a Quality Perspective written by Eugene R. Hnatek. This book was released on 1993-08-31. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Ian Grout
Release : 2006
Genre : Computers
Kind : eBook
Book Rating : /5 ( reviews)
Book Synopsis Integrated Circuit Test Engineering by : Ian Grout
Download or read book Integrated Circuit Test Engineering written by Ian Grout. This book was released on 2006. Available in PDF, EPUB and Kindle. Book excerpt: Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Author : Peter Shepherd
Release : 1996
Genre : Technology & Engineering
Kind : eBook
Book Rating : /5 ( reviews)
Book Synopsis Integrated Circuit Design, Fabrication, and Test by : Peter Shepherd
Download or read book Integrated Circuit Design, Fabrication, and Test written by Peter Shepherd. This book was released on 1996. Available in PDF, EPUB and Kindle. Book excerpt: All aspects of chip realization for both digital and analog circuits are covered. Electronics engineers are shown how to choose appropriate technololgy and circuit architecture, and plan the IC design. They'll gain expert information on power consaiderations, the advantages and disadvantages of each IC architecture, and aspects of design for testability.
Author : Jose Luis Huertas Díaz
Release : 2010-02-23
Genre : Technology & Engineering
Kind : eBook
Book Rating : 213/5 ( reviews)
Book Synopsis Test and Design-for-Testability in Mixed-Signal Integrated Circuits by : Jose Luis Huertas Díaz
Download or read book Test and Design-for-Testability in Mixed-Signal Integrated Circuits written by Jose Luis Huertas Díaz. This book was released on 2010-02-23. Available in PDF, EPUB and Kindle. Book excerpt: Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.
Author : F.P.M. Beenker
Release : 2012-12-06
Genre : Technology & Engineering
Kind : eBook
Book Rating : 656/5 ( reviews)
Book Synopsis Testability Concepts for Digital ICs by : F.P.M. Beenker
Download or read book Testability Concepts for Digital ICs written by F.P.M. Beenker. This book was released on 2012-12-06. Available in PDF, EPUB and Kindle. Book excerpt: Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on. All four items have to be treated, managed, and to a great extent integrated before the term 'IC quality' gets a certain meaning and a test a certain measurable value. The contents of this book reflects our activities on testability concepts for complex digital ICs as performed at Philips Research Laboratories in Eindhoven, The Netherlands. Based on the statements above, we have worked along a long term plan, which was based on four pillars. 1. The definition of a test methodology suitable for 'future' IC design styles, 2. capable of handling improved defect models, 3. supported by software tools, and 4. providing an easy link to Automatic Test Equipment. The reasoning we have followed was continuously focused on IC qUality. Quality expressed in terms of the ability of delivering a customer a device with no residual manufacturing defects. Bad devices should not escape a test. The basis of IC quality is a thorough understanding of defects and defect models.
