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X-Ray Line Profile Analysis in Materials Science

2014-03-31 Technology & Engineering
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Release : 2014-03-31
Genre : Technology & Engineering
Kind : eBook
Book Rating : 533/5 ( reviews)

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Book Synopsis X-Ray Line Profile Analysis in Materials Science by : Gubicza, Jen?

Download or read book X-Ray Line Profile Analysis in Materials Science written by Gubicza, Jen?. This book was released on 2014-03-31. Available in PDF, EPUB and Kindle. Book excerpt: X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

X-Ray Line Profile Analysis in Materials Science

2014 Materials
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Release : 2014
Genre : Materials
Kind : eBook
Book Rating : 547/5 ( reviews)

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Book Synopsis X-Ray Line Profile Analysis in Materials Science by : Jeno Gubicza

Download or read book X-Ray Line Profile Analysis in Materials Science written by Jeno Gubicza. This book was released on 2014. Available in PDF, EPUB and Kindle. Book excerpt: "This book aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings"--

Diffraction Analysis of the Microstructure of Materials

2013-11-21 Science
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Release : 2013-11-21
Genre : Science
Kind : eBook
Book Rating : 234/5 ( reviews)

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Book Synopsis Diffraction Analysis of the Microstructure of Materials by : Eric J. Mittemeijer

Download or read book Diffraction Analysis of the Microstructure of Materials written by Eric J. Mittemeijer. This book was released on 2013-11-21. Available in PDF, EPUB and Kindle. Book excerpt: Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.

X-ray Characterization of Materials

2008-07-11 Technology & Engineering
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Release : 2008-07-11
Genre : Technology & Engineering
Kind : eBook
Book Rating : 757/5 ( reviews)

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Book Synopsis X-ray Characterization of Materials by : Eric Lifshin

Download or read book X-ray Characterization of Materials written by Eric Lifshin. This book was released on 2008-07-11. Available in PDF, EPUB and Kindle. Book excerpt: Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.

Thin Film Analysis by X-Ray Scattering

2006-05-12 Technology & Engineering
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Release : 2006-05-12
Genre : Technology & Engineering
Kind : eBook
Book Rating : 048/5 ( reviews)

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Book Synopsis Thin Film Analysis by X-Ray Scattering by : Mario Birkholz

Download or read book Thin Film Analysis by X-Ray Scattering written by Mario Birkholz. This book was released on 2006-05-12. Available in PDF, EPUB and Kindle. Book excerpt: With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.

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