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Two-step MOVPE, in-situ etching and buried implantation: applications to the realization of GaAs laser diodes

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Release : 2021-03-25
Genre : Science
Kind : eBook
Book Rating : 971/5 ( reviews)

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Book Synopsis Two-step MOVPE, in-situ etching and buried implantation: applications to the realization of GaAs laser diodes by : Pietro della Casa

Download or read book Two-step MOVPE, in-situ etching and buried implantation: applications to the realization of GaAs laser diodes written by Pietro della Casa. This book was released on 2021-03-25. Available in PDF, EPUB and Kindle. Book excerpt: This work is about two-step epitaxial growth using metalorganic vapor-phase epitaxy (MOVPE) for the realization of edge-emitting near-infrared laser diodes. The fabricated gallium arsenide-based devices fall into two categories: high-power lasers (watt range, multimodal) and tunable lasers (milliwatt range, monomodal). Common to both cases is that surface contamination – particularly that due to oxygen – needs to be removed before regrowth. Thus, in-situ etching with carbon tetrabromide (CBr4) is first studied. The experimental results include kinetic data, the effects of different etching conditions as well as substrate characteristics, and the effectiveness in reducing surface contamination. These investigations pave the way to devices based on 2-step epitaxy combined with in-situ etching. Correspondingly, thermally-tuned SG-DBR lasers operating around 975 nm have been successfully realized, obtaining a tuning range of 21 nm. In addition, the possibility of using electronic tuning in similar devices has been explored. High-power broad-area lasers have also been realized, using two-step epitaxy combined with ex-situ and in-situ etching, to create a buried, shallow “mesa” containing the active zone. This approach allows introducing lateral electrical and optical confinement, and – simultaneously – non-absorbing mirrors at the laser facets. Additionally, a different strategy to create a buried current aperture is presented, which is based on ion implantation followed by epitaxial regrowth. This enables to improve device performance and simultaneously introduce non-absorbing mirrors at the facets with correspondingly increased reliability.

Physics Briefs

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Release : 1991
Genre : Physics
Kind : eBook
Book Rating : /5 ( reviews)

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Download or read book Physics Briefs written by . This book was released on 1991. Available in PDF, EPUB and Kindle. Book excerpt:

Electrical & Electronics Abstracts

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Author :
Release : 1997
Genre : Electrical engineering
Kind : eBook
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Download or read book Electrical & Electronics Abstracts written by . This book was released on 1997. Available in PDF, EPUB and Kindle. Book excerpt:

Chemical Abstracts

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Author :
Release : 2002
Genre : Chemistry
Kind : eBook
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Book Synopsis Chemical Abstracts by :

Download or read book Chemical Abstracts written by . This book was released on 2002. Available in PDF, EPUB and Kindle. Book excerpt:

Semiconductor Laser Engineering, Reliability and Diagnostics

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Release : 2013-01-25
Genre : Technology & Engineering
Kind : eBook
Book Rating : 860/5 ( reviews)

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Book Synopsis Semiconductor Laser Engineering, Reliability and Diagnostics by : Peter W. Epperlein

Download or read book Semiconductor Laser Engineering, Reliability and Diagnostics written by Peter W. Epperlein. This book was released on 2013-01-25. Available in PDF, EPUB and Kindle. Book excerpt: This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.

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