Share

Thermal-Aware Testing of Digital VLSI Circuits and Systems

2018-04-24 Technology & Engineering
Download Thermal-Aware Testing of Digital VLSI Circuits and Systems PDF Online Free

Author :
Release : 2018-04-24
Genre : Technology & Engineering
Kind : eBook
Book Rating : 777/5 ( reviews)

GET EBOOK


Book Synopsis Thermal-Aware Testing of Digital VLSI Circuits and Systems by : Santanu Chattopadhyay

Download or read book Thermal-Aware Testing of Digital VLSI Circuits and Systems written by Santanu Chattopadhyay. This book was released on 2018-04-24. Available in PDF, EPUB and Kindle. Book excerpt: This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips

Thermal Aware Testing Techniques for Digital VLSI Circuits

2017-05-18
Download Thermal Aware Testing Techniques for Digital VLSI Circuits PDF Online Free

Author :
Release : 2017-05-18
Genre :
Kind : eBook
Book Rating : 313/5 ( reviews)

GET EBOOK


Book Synopsis Thermal Aware Testing Techniques for Digital VLSI Circuits by : Arpita Dutta

Download or read book Thermal Aware Testing Techniques for Digital VLSI Circuits written by Arpita Dutta. This book was released on 2017-05-18. Available in PDF, EPUB and Kindle. Book excerpt:

Circadian Rhythms for Future Resilient Electronic Systems

2019-06-12 Technology & Engineering
Download Circadian Rhythms for Future Resilient Electronic Systems PDF Online Free

Author :
Release : 2019-06-12
Genre : Technology & Engineering
Kind : eBook
Book Rating : 515/5 ( reviews)

GET EBOOK


Book Synopsis Circadian Rhythms for Future Resilient Electronic Systems by : Xinfei Guo

Download or read book Circadian Rhythms for Future Resilient Electronic Systems written by Xinfei Guo. This book was released on 2019-06-12. Available in PDF, EPUB and Kindle. Book excerpt: This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware; Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow; Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems; Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both; Includes coverage of resilient aspects of emerging applications such as IoT.

Design and Test Strategies for 2D/3D Integration for NoC-based Multicore Architectures

2019-12-20 Technology & Engineering
Download Design and Test Strategies for 2D/3D Integration for NoC-based Multicore Architectures PDF Online Free

Author :
Release : 2019-12-20
Genre : Technology & Engineering
Kind : eBook
Book Rating : 107/5 ( reviews)

GET EBOOK


Book Synopsis Design and Test Strategies for 2D/3D Integration for NoC-based Multicore Architectures by : Kanchan Manna

Download or read book Design and Test Strategies for 2D/3D Integration for NoC-based Multicore Architectures written by Kanchan Manna. This book was released on 2019-12-20. Available in PDF, EPUB and Kindle. Book excerpt: This book covers various aspects of optimization in design and testing of Network-on-Chip (NoC) based multicore systems. It gives a complete account of the state-of-the-art and emerging techniques for near optimal mapping and test scheduling for NoC-based multicores. The authors describe the use of the Integer Line Programming (ILP) technique for smaller benchmarks and a Particle Swarm Optimization (PSO) to get a near optimal mapping and test schedule for bigger benchmarks. The PSO-based approach is also augmented with several innovative techniques to get the best possible solution. The tradeoff between performance (communication or test time) of the system and thermal-safety is also discussed, based on designer specifications. Provides a single-source reference to design and test for circuit and system-level approaches to (NoC) based multicore systems; Gives a complete account of the state-of-the-art and emerging techniques for near optimal mapping and test scheduling in (NoC) based multicore systems; Organizes chapters systematically and hierarchically, rather than in an ad hoc manner, covering aspects of optimization in design and testing of Network-on-Chip (NoC) based multicore systems.

Power-Aware Testing and Test Strategies for Low Power Devices

2010-03-11 Technology & Engineering
Download Power-Aware Testing and Test Strategies for Low Power Devices PDF Online Free

Author :
Release : 2010-03-11
Genre : Technology & Engineering
Kind : eBook
Book Rating : 281/5 ( reviews)

GET EBOOK


Book Synopsis Power-Aware Testing and Test Strategies for Low Power Devices by : Patrick Girard

Download or read book Power-Aware Testing and Test Strategies for Low Power Devices written by Patrick Girard. This book was released on 2010-03-11. Available in PDF, EPUB and Kindle. Book excerpt: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

You may also like...