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Techniques for Variation Aware Modeling in Static Timing Analysis of Integrated Circuits

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Release : 2010
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Kind : eBook
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Book Synopsis Techniques for Variation Aware Modeling in Static Timing Analysis of Integrated Circuits by : Suryanarayana Pendela

Download or read book Techniques for Variation Aware Modeling in Static Timing Analysis of Integrated Circuits written by Suryanarayana Pendela. This book was released on 2010. Available in PDF, EPUB and Kindle. Book excerpt: Much of the Semiconductor Industry's success can be attributed to Moore's law which states that the number of transistors on an integrated circuit would double approximately every two years. Semiconductor industry has ever since progressed from designs with a few hundred transistors to today's complex designs incorporating millions of transistors. The current era of nanometer technologies threatens to impact the sustainability of Moore's law with random variations in the manufacturing process impacting yield in a big way. Considerable research efforts have since been devoted to account for these variations leading to a new paradigm called Design for Manufacturing (DFM). Traditional Static Timing Analysis (STA) has given way to Statistical Static Timing Analysis (SSTA) techniques wherein the parameters considered are treated as random variables with assigned probability distribution functions. However, SSTA is still not seen as a mature flow for commercial adoption, owing to the inherent complex nature of the SSTA algorithms. In this thesis, we propose an alternate framework to STA under the presence of process variations using Interval Valued Static Timing Analysis (IVSTA). Process variations are accounted for by using a macro-modeling framework providing an efficient and fast timing analysis technique. Results on standard benchmarks show that IVSTA can predict the timing slack by a margin of 5-10% error and huge improvement of runtime compared to traditional corner based analysis. The framework involves a one-time characterization of the standard cell library and can be incorporated without much modification to the design flow. An iterative optimization framework using IVSTA engine is also presented which optimizes a routed netlist for variations at a minimum penalty of area and power.

Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide

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Release : 2012-10-02
Genre : Technology & Engineering
Kind : eBook
Book Rating : 698/5 ( reviews)

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Book Synopsis Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide by : Trent McConaghy

Download or read book Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide written by Trent McConaghy. This book was released on 2012-10-02. Available in PDF, EPUB and Kindle. Book excerpt: This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers.

Static Timing Analysis for Nanometer Designs

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Release : 2009-04-03
Genre : Technology & Engineering
Kind : eBook
Book Rating : 206/5 ( reviews)

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Book Synopsis Static Timing Analysis for Nanometer Designs by : J. Bhasker

Download or read book Static Timing Analysis for Nanometer Designs written by J. Bhasker. This book was released on 2009-04-03. Available in PDF, EPUB and Kindle. Book excerpt: iming, timing, timing! That is the main concern of a digital designer charged with designing a semiconductor chip. What is it, how is it T described, and how does one verify it? The design team of a large digital design may spend months architecting and iterating the design to achieve the required timing target. Besides functional verification, the t- ing closure is the major milestone which dictates when a chip can be - leased to the semiconductor foundry for fabrication. This book addresses the timing verification using static timing analysis for nanometer designs. The book has originated from many years of our working in the area of timing verification for complex nanometer designs. We have come across many design engineers trying to learn the background and various aspects of static timing analysis. Unfortunately, there is no book currently ava- able that can be used by a working engineer to get acquainted with the - tails of static timing analysis. The chip designers lack a central reference for information on timing, that covers the basics to the advanced timing veri- cation procedures and techniques.

Circuit Timing and Leakage Analysis in the Presence of Variability

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Release : 2010
Genre :
Kind : eBook
Book Rating : /5 ( reviews)

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Book Synopsis Circuit Timing and Leakage Analysis in the Presence of Variability by : Khaled R. Heloue

Download or read book Circuit Timing and Leakage Analysis in the Presence of Variability written by Khaled R. Heloue. This book was released on 2010. Available in PDF, EPUB and Kindle. Book excerpt:

Lifetime Reliability-aware Design of Integrated Circuits

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Release : 2022-11-16
Genre : Technology & Engineering
Kind : eBook
Book Rating : 456/5 ( reviews)

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Book Synopsis Lifetime Reliability-aware Design of Integrated Circuits by : Mohsen Raji

Download or read book Lifetime Reliability-aware Design of Integrated Circuits written by Mohsen Raji. This book was released on 2022-11-16. Available in PDF, EPUB and Kindle. Book excerpt: This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.

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