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Nanoscale Semiconductor Memories

2017-07-28 Technology & Engineering
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Release : 2017-07-28
Genre : Technology & Engineering
Kind : eBook
Book Rating : 614/5 ( reviews)

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Book Synopsis Nanoscale Semiconductor Memories by : Santosh K. Kurinec

Download or read book Nanoscale Semiconductor Memories written by Santosh K. Kurinec. This book was released on 2017-07-28. Available in PDF, EPUB and Kindle. Book excerpt: Nanoscale memories are used everywhere. From your iPhone to a supercomputer, every electronic device contains at least one such type. With coverage of current and prototypical technologies, Nanoscale Semiconductor Memories: Technology and Applications presents the latest research in the field of nanoscale memories technology in one place. It also covers a myriad of applications that nanoscale memories technology has enabled. The book begins with coverage of SRAM, addressing the design challenges as the technology scales, then provides design strategies to mitigate radiation induced upsets in SRAM. It discusses the current state-of-the-art DRAM technology and the need to develop high performance sense amplifier circuitry. The text then covers the novel concept of capacitorless 1T DRAM, termed as Advanced-RAM or A-RAM, and presents a discussion on quantum dot (QD) based flash memory. Building on this foundation, the coverage turns to STT-RAM, emphasizing scalable embedded STT-RAM, and the physics and engineering of magnetic domain wall "racetrack" memory. The book also discusses state-of-the-art modeling applied to phase change memory devices and includes an extensive review of RRAM, highlighting the physics of operation and analyzing different materials systems currently under investigation. The hunt is still on for universal memory that fits all the requirements of an "ideal memory" capable of high-density storage, low-power operation, unparalleled speed, high endurance, and low cost. Taking an interdisciplinary approach, this book bridges technological and application issues to provide the groundwork for developing custom designed memory systems.

Nanoscale Semiconductor Memories

2017-07-28 Technology & Engineering
Download Nanoscale Semiconductor Memories PDF Online Free

Author :
Release : 2017-07-28
Genre : Technology & Engineering
Kind : eBook
Book Rating : 085/5 ( reviews)

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Book Synopsis Nanoscale Semiconductor Memories by : Santosh K. Kurinec

Download or read book Nanoscale Semiconductor Memories written by Santosh K. Kurinec. This book was released on 2017-07-28. Available in PDF, EPUB and Kindle. Book excerpt: Nanoscale memories are used everywhere. From your iPhone to a supercomputer, every electronic device contains at least one such type. With coverage of current and prototypical technologies, Nanoscale Semiconductor Memories: Technology and Applications presents the latest research in the field of nanoscale memories technology in one place. It also covers a myriad of applications that nanoscale memories technology has enabled. The book begins with coverage of SRAM, addressing the design challenges as the technology scales, then provides design strategies to mitigate radiation induced upsets in SRAM. It discusses the current state-of-the-art DRAM technology and the need to develop high performance sense amplifier circuitry. The text then covers the novel concept of capacitorless 1T DRAM, termed as Advanced-RAM or A-RAM, and presents a discussion on quantum dot (QD) based flash memory. Building on this foundation, the coverage turns to STT-RAM, emphasizing scalable embedded STT-RAM, and the physics and engineering of magnetic domain wall "racetrack" memory. The book also discusses state-of-the-art modeling applied to phase change memory devices and includes an extensive review of RRAM, highlighting the physics of operation and analyzing different materials systems currently under investigation. The hunt is still on for universal memory that fits all the requirements of an "ideal memory" capable of high-density storage, low-power operation, unparalleled speed, high endurance, and low cost. Taking an interdisciplinary approach, this book bridges technological and application issues to provide the groundwork for developing custom designed memory systems.

Nanoscale Memory Repair

2011-01-11 Technology & Engineering
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Release : 2011-01-11
Genre : Technology & Engineering
Kind : eBook
Book Rating : 581/5 ( reviews)

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Book Synopsis Nanoscale Memory Repair by : Masashi Horiguchi

Download or read book Nanoscale Memory Repair written by Masashi Horiguchi. This book was released on 2011-01-11. Available in PDF, EPUB and Kindle. Book excerpt: Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.

Extreme Statistics in Nanoscale Memory Design

2010-09-09 Technology & Engineering
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Release : 2010-09-09
Genre : Technology & Engineering
Kind : eBook
Book Rating : 064/5 ( reviews)

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Book Synopsis Extreme Statistics in Nanoscale Memory Design by : Amith Singhee

Download or read book Extreme Statistics in Nanoscale Memory Design written by Amith Singhee. This book was released on 2010-09-09. Available in PDF, EPUB and Kindle. Book excerpt: Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri?ce too much in terms of power consumption or manufacturing cost, to the extent of making the design goals even infeasible. We absolutely need to explicitly account for the statistics of this random variability, to have design margins that are accurate so that we can ?nd the optimum balance between yield loss and design cost. This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs. Memory circuits tend to be the hardest hit by the problem of these random variations because of their high replication count on any single chip, which demands a very high statistical quality from the product. Requirements of 5–6s (0.

Noise in Nanoscale Semiconductor Devices

2020-04-26 Technology & Engineering
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Release : 2020-04-26
Genre : Technology & Engineering
Kind : eBook
Book Rating : 005/5 ( reviews)

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Book Synopsis Noise in Nanoscale Semiconductor Devices by : Tibor Grasser

Download or read book Noise in Nanoscale Semiconductor Devices written by Tibor Grasser. This book was released on 2020-04-26. Available in PDF, EPUB and Kindle. Book excerpt: This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.

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