Metrology and Diagnostic Techniques for Nanoelectronics

2017-03-27 Science

Author : Zhiyong Ma
Release : 2017-03-27
Genre : Science
Kind : eBook
Book Rating : 958/5 ( reviews)

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Book Synopsis Metrology and Diagnostic Techniques for Nanoelectronics by : Zhiyong Ma

Download or read book Metrology and Diagnostic Techniques for Nanoelectronics written by Zhiyong Ma. This book was released on 2017-03-27. Available in PDF, EPUB and Kindle. Book excerpt: Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

Electrical Atomic Force Microscopy for Nanoelectronics

2019-08-01 Science

Author : Umberto Celano
Release : 2019-08-01
Genre : Science
Kind : eBook
Book Rating : 125/5 ( reviews)

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Book Synopsis Electrical Atomic Force Microscopy for Nanoelectronics by : Umberto Celano

Download or read book Electrical Atomic Force Microscopy for Nanoelectronics written by Umberto Celano. This book was released on 2019-08-01. Available in PDF, EPUB and Kindle. Book excerpt: The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.

Measurement Techniques for Radio Frequency Nanoelectronics

2017-09-14 Technology & Engineering

Author : T. Mitch Wallis
Release : 2017-09-14
Genre : Technology & Engineering
Kind : eBook
Book Rating : 315/5 ( reviews)

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Book Synopsis Measurement Techniques for Radio Frequency Nanoelectronics by : T. Mitch Wallis

Download or read book Measurement Techniques for Radio Frequency Nanoelectronics written by T. Mitch Wallis. This book was released on 2017-09-14. Available in PDF, EPUB and Kindle. Book excerpt: Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. • Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides • Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy • Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.

Fundamental Principles of Engineering Nanometrology

2009-09-03 Technology & Engineering

Author : Richard Leach
Release : 2009-09-03
Genre : Technology & Engineering
Kind : eBook
Book Rating : 321/5 ( reviews)

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Book Synopsis Fundamental Principles of Engineering Nanometrology by : Richard Leach

Download or read book Fundamental Principles of Engineering Nanometrology written by Richard Leach. This book was released on 2009-09-03. Available in PDF, EPUB and Kindle. Book excerpt: Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study. - Provides a basic introduction to measurement and instruments - Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force - Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal, variable focus, and scattering instruments) - Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties) - Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge

Surfactants in Precision Cleaning

2021-10-21 Technology & Engineering

Author : Rajiv Kohli
Release : 2021-10-21
Genre : Technology & Engineering
Kind : eBook
Book Rating : 174/5 ( reviews)

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Book Synopsis Surfactants in Precision Cleaning by : Rajiv Kohli

Download or read book Surfactants in Precision Cleaning written by Rajiv Kohli. This book was released on 2021-10-21. Available in PDF, EPUB and Kindle. Book excerpt: Surfactants in Precision Cleaning: Removal of Contaminants at the Micro and Nanoscale is a single source of information on surfactants, emulsions, microemulsions and detergents for removal of surface contaminants at the micro and nanoscale. The topics covered include cleaning mechanisms, effect of surfactants, types of stable dispersions (emulsions, microemulsions, surfactants, detergents, etc.), cleaning technology, and cleaning applications. Users will find this volume an excellent resource on the use of stable dispersions in precision cleaning. - Single source of current information on surfactants, emulsions, microemulsions and detergents for precision cleaning applications - Includes a list of extensive reference sources - Discusses specific selection and properties of surfactants and their use in cleaning - Provides a guide for cleaning applications in different industry sectors

Popular eBooks

Metrology and Diagnostic Techniques for Nanoelectronics

Electrical Atomic Force Microscopy for Nanoelectronics

Measurement Techniques for Radio Frequency Nanoelectronics

Fundamental Principles of Engineering Nanometrology

Surfactants in Precision Cleaning

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