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Handbook of Metrology and Applications

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Release : 2023-08-23
Genre : Technology & Engineering
Kind : eBook
Book Rating : 744/5 ( reviews)

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Book Synopsis Handbook of Metrology and Applications by : Dinesh K. Aswal

Download or read book Handbook of Metrology and Applications written by Dinesh K. Aswal. This book was released on 2023-08-23. Available in PDF, EPUB and Kindle. Book excerpt: ​This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields.

Handbook of Optical Metrology

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Release : 2009-02-25
Genre : Science
Kind : eBook
Book Rating : 511/5 ( reviews)

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Book Synopsis Handbook of Optical Metrology by : Toru Yoshizawa

Download or read book Handbook of Optical Metrology written by Toru Yoshizawa. This book was released on 2009-02-25. Available in PDF, EPUB and Kindle. Book excerpt: The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals. Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications. With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.

Handbook of Optical Metrology

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Author :
Release : 2017-07-28
Genre : Technology & Engineering
Kind : eBook
Book Rating : 844/5 ( reviews)

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Book Synopsis Handbook of Optical Metrology by : Toru Yoshizawa

Download or read book Handbook of Optical Metrology written by Toru Yoshizawa. This book was released on 2017-07-28. Available in PDF, EPUB and Kindle. Book excerpt: Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.

Handbook of Optical Dimensional Metrology

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Release : 2016-04-19
Genre : Science
Kind : eBook
Book Rating : 823/5 ( reviews)

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Book Synopsis Handbook of Optical Dimensional Metrology by : Kevin Harding

Download or read book Handbook of Optical Dimensional Metrology written by Kevin Harding. This book was released on 2016-04-19. Available in PDF, EPUB and Kindle. Book excerpt: Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods

Handbook of Silicon Semiconductor Metrology

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Release : 2001-06-29
Genre : Technology & Engineering
Kind : eBook
Book Rating : 540/5 ( reviews)

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Book Synopsis Handbook of Silicon Semiconductor Metrology by : Alain C. Diebold

Download or read book Handbook of Silicon Semiconductor Metrology written by Alain C. Diebold. This book was released on 2001-06-29. Available in PDF, EPUB and Kindle. Book excerpt: Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay

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