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Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

2005-08-25 Science
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Release : 2005-08-25
Genre : Science
Kind : eBook
Book Rating : 38X/5 ( reviews)

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Book Synopsis Electron Microprobe Analysis and Scanning Electron Microscopy in Geology by : S. J. B. Reed

Download or read book Electron Microprobe Analysis and Scanning Electron Microscopy in Geology written by S. J. B. Reed. This book was released on 2005-08-25. Available in PDF, EPUB and Kindle. Book excerpt: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

2010-06-10 Science
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Release : 2010-06-10
Genre : Science
Kind : eBook
Book Rating : 304/5 ( reviews)

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Book Synopsis Electron Microprobe Analysis and Scanning Electron Microscopy in Geology by : S. J. B. Reed

Download or read book Electron Microprobe Analysis and Scanning Electron Microscopy in Geology written by S. J. B. Reed. This book was released on 2010-06-10. Available in PDF, EPUB and Kindle. Book excerpt: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Practical Scanning Electron Microscopy

2012-12-06 Technology & Engineering
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Release : 2012-12-06
Genre : Technology & Engineering
Kind : eBook
Book Rating : 220/5 ( reviews)

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Book Synopsis Practical Scanning Electron Microscopy by : Joseph Goldstein

Download or read book Practical Scanning Electron Microscopy written by Joseph Goldstein. This book was released on 2012-12-06. Available in PDF, EPUB and Kindle. Book excerpt: In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Scanning Electron Microscopy and X-Ray Microanalysis

2013-11-11 Science
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Release : 2013-11-11
Genre : Science
Kind : eBook
Book Rating : 737/5 ( reviews)

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Book Synopsis Scanning Electron Microscopy and X-Ray Microanalysis by : Joseph Goldstein

Download or read book Scanning Electron Microscopy and X-Ray Microanalysis written by Joseph Goldstein. This book was released on 2013-11-11. Available in PDF, EPUB and Kindle. Book excerpt: This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks

2005-09-15 Science
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Release : 2005-09-15
Genre : Science
Kind : eBook
Book Rating : 743/5 ( reviews)

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Book Synopsis Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks by : David H. Krinsley

Download or read book Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks written by David H. Krinsley. This book was released on 2005-09-15. Available in PDF, EPUB and Kindle. Book excerpt: Backscattered scanning electron microscopy (BSE) reveals the minerals, textures, and fabrics of sediments and rocks in much greater detail than is possible with conventional optical microscopy. Backscattered Scanning Electron Microscopy provides a concise summary of the BSE technique. This comprehensive guide uses abundant images to illustrate the type of information BSE yields and the application of the technique to the study of sediments and sedimentary rocks. The authors review the use of this petrographic technique on all the major sedimentary rock types, including sediment grains, sandstones, shales, carbonate rocks, rock varnish, and glauconite. They also describe image analysis techniques that allow quantification of backscattered scanning electron microscope images. Heavily illustrated and lucidly written, this book will provide researchers and graduate students with the most current research on this important geological tool.

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