Share

Digital Circuit Testing and Testability

1997 Computers
Download Digital Circuit Testing and Testability PDF Online Free

Author :
Release : 1997
Genre : Computers
Kind : eBook
Book Rating : 306/5 ( reviews)

GET EBOOK


Book Synopsis Digital Circuit Testing and Testability by : Parag K. Lala

Download or read book Digital Circuit Testing and Testability written by Parag K. Lala. This book was released on 1997. Available in PDF, EPUB and Kindle. Book excerpt: An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.

An Introduction to Logic Circuit Testing

2022-06-01 Technology & Engineering
Download An Introduction to Logic Circuit Testing PDF Online Free

Author :
Release : 2022-06-01
Genre : Technology & Engineering
Kind : eBook
Book Rating : 85X/5 ( reviews)

GET EBOOK


Book Synopsis An Introduction to Logic Circuit Testing by : Parag K. Lala

Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala. This book was released on 2022-06-01. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Digital Circuit Testing

2012-12-02 Technology & Engineering
Download Digital Circuit Testing PDF Online Free

Author :
Release : 2012-12-02
Genre : Technology & Engineering
Kind : eBook
Book Rating : 345/5 ( reviews)

GET EBOOK


Book Synopsis Digital Circuit Testing by : Francis C. Wong

Download or read book Digital Circuit Testing written by Francis C. Wong. This book was released on 2012-12-02. Available in PDF, EPUB and Kindle. Book excerpt: Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

Digital Systems Testing and Testable Design

1994-09-27 Technology & Engineering
Download Digital Systems Testing and Testable Design PDF Online Free

Author :
Release : 1994-09-27
Genre : Technology & Engineering
Kind : eBook
Book Rating : 629/5 ( reviews)

GET EBOOK


Book Synopsis Digital Systems Testing and Testable Design by : Miron Abramovici

Download or read book Digital Systems Testing and Testable Design written by Miron Abramovici. This book was released on 1994-09-27. Available in PDF, EPUB and Kindle. Book excerpt: This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

Digital System Test and Testable Design

2010-12-10 Technology & Engineering
Download Digital System Test and Testable Design PDF Online Free

Author :
Release : 2010-12-10
Genre : Technology & Engineering
Kind : eBook
Book Rating : 489/5 ( reviews)

GET EBOOK


Book Synopsis Digital System Test and Testable Design by : Zainalabedin Navabi

Download or read book Digital System Test and Testable Design written by Zainalabedin Navabi. This book was released on 2010-12-10. Available in PDF, EPUB and Kindle. Book excerpt: This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.

You may also like...