Share

Design for Manufacturability and Yield for Nano-Scale CMOS

Download Design for Manufacturability and Yield for Nano-Scale CMOS PDF Online Free

Author :
Release : 2007-06-15
Genre : Technology & Engineering
Kind : eBook
Book Rating : 883/5 ( reviews)

GET EBOOK


Book Synopsis Design for Manufacturability and Yield for Nano-Scale CMOS by : Charles Chiang

Download or read book Design for Manufacturability and Yield for Nano-Scale CMOS written by Charles Chiang. This book was released on 2007-06-15. Available in PDF, EPUB and Kindle. Book excerpt: This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.

Design For Manufacturability And Yield For Nano-Scale Cmos

Download Design For Manufacturability And Yield For Nano-Scale Cmos PDF Online Free

Author :
Release : 2009-06-01
Genre :
Kind : eBook
Book Rating : 444/5 ( reviews)

GET EBOOK


Book Synopsis Design For Manufacturability And Yield For Nano-Scale Cmos by : Chiang

Download or read book Design For Manufacturability And Yield For Nano-Scale Cmos written by Chiang. This book was released on 2009-06-01. Available in PDF, EPUB and Kindle. Book excerpt:

Nanoscale CMOS VLSI Circuits: Design for Manufacturability

Download Nanoscale CMOS VLSI Circuits: Design for Manufacturability PDF Online Free

Author :
Release : 2010-06-22
Genre : Technology & Engineering
Kind : eBook
Book Rating : 203/5 ( reviews)

GET EBOOK


Book Synopsis Nanoscale CMOS VLSI Circuits: Design for Manufacturability by : Sandip Kundu

Download or read book Nanoscale CMOS VLSI Circuits: Design for Manufacturability written by Sandip Kundu. This book was released on 2010-06-22. Available in PDF, EPUB and Kindle. Book excerpt: Cutting-Edge CMOS VLSI Design for Manufacturability Techniques This detailed guide offers proven methods for optimizing circuit designs to increase the yield, reliability, and manufacturability of products and mitigate defects and failure. Covering the latest devices, technologies, and processes, Nanoscale CMOS VLSI Circuits: Design for Manufacturability focuses on delivering higher performance and lower power consumption. Costs, constraints, and computational efficiencies are also discussed in the practical resource. Nanoscale CMOS VLSI Circuits covers: Current trends in CMOS VLSI design Semiconductor manufacturing technologies Photolithography Process and device variability: analyses and modeling Manufacturing-Aware Physical Design Closure Metrology, manufacturing defects, and defect extraction Defect impact modeling and yield improvement techniques Physical design and reliability DFM tools and methodologies

Nano-CMOS Design for Manufacturability

Download Nano-CMOS Design for Manufacturability PDF Online Free

Author :
Release : 2008-12-29
Genre : Technology & Engineering
Kind : eBook
Book Rating : 813/5 ( reviews)

GET EBOOK


Book Synopsis Nano-CMOS Design for Manufacturability by : Ban P. Wong

Download or read book Nano-CMOS Design for Manufacturability written by Ban P. Wong. This book was released on 2008-12-29. Available in PDF, EPUB and Kindle. Book excerpt: Discover innovative tools that pave the way from circuit and physical design to fabrication processing Nano-CMOS Design for Manufacturability examines the challenges that design engineers face in the nano-scaled era, such as exacerbated effects and the proven design for manufacturability (DFM) methodology in the midst of increasing variability and design process interactions. In addition to discussing the difficulties brought on by the continued dimensional scaling in conformance with Moore's law, the authors also tackle complex issues in the design process to overcome the difficulties, including the use of a functional first silicon to support a predictable product ramp. Moreover, they introduce several emerging concepts, including stress proximity effects, contour-based extraction, and design process interactions. This book is the sequel to Nano-CMOS Circuit and Physical Design, taking design to technology nodes beyond 65nm geometries. It is divided into three parts: Part One, Newly Exacerbated Effects, introduces the newly exacerbated effects that require designers' attention, beginning with a discussion of the lithography aspects of DFM, followed by the impact of layout on transistor performance Part Two, Design Solutions, examines how to mitigate the impact of process effects, discussing the methodology needed to make sub-wavelength patterning technology work in manufacturing, as well as design solutions to deal with signal, power integrity, WELL, stress proximity effects, and process variability Part Three, The Road to DFM, describes new tools needed to support DFM efforts, including an auto-correction tool capable of fixing the layout of cells with multiple optimization goals, followed by a look ahead into the future of DFM Throughout the book, real-world examples simplify complex concepts, helping readers see how they can successfully handle projects on Nano-CMOS nodes. It provides a bridge that allows engineers to go from physical and circuit design to fabrication processing and, in short, make designs that are not only functional, but that also meet power and performance goals within the design schedule.

Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies

Download Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies PDF Online Free

Author :
Release : 2020-03-20
Genre : Technology & Engineering
Kind : eBook
Book Rating : 368/5 ( reviews)

GET EBOOK


Book Synopsis Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies by : António Manuel Lourenço Canelas

Download or read book Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies written by António Manuel Lourenço Canelas. This book was released on 2020-03-20. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall optimization processes enables IC designers to perform yield optimization with the most accurate yield estimation method, MC simulations using foundry statistical device models considering local and global variations. The methodology described by the authors delivers on average a reduction of 89% in the total number of MC simulations, when compared to the exhaustive MC analysis over the full population. In addition to describing a newly developed yield estimation technique, the authors also provide detailed background on automatic analog IC sizing and optimization.

You may also like...