Characterization, integration and reliability of HfO2 and LaLuO3 high-κ/metal gate stacks for CMOS applications

2014-04-03

Author : Alexander Nichau
Release : 2014-04-03
Genre :
Kind : eBook
Book Rating : 981/5 ( reviews)

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Book Synopsis Characterization, integration and reliability of HfO2 and LaLuO3 high-κ/metal gate stacks for CMOS applications by : Alexander Nichau

Download or read book Characterization, integration and reliability of HfO2 and LaLuO3 high-κ/metal gate stacks for CMOS applications written by Alexander Nichau. This book was released on 2014-04-03. Available in PDF, EPUB and Kindle. Book excerpt:

Characterization, Integration and Reliability of HfO2 and LaLuO3 High-kappa/metal Gate Stacks for CMOS Applications

2013

Author : Alexander Nichau
Release : 2013
Genre :
Kind : eBook
Book Rating : /5 ( reviews)

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Book Synopsis Characterization, Integration and Reliability of HfO2 and LaLuO3 High-kappa/metal Gate Stacks for CMOS Applications by : Alexander Nichau

Download or read book Characterization, Integration and Reliability of HfO2 and LaLuO3 High-kappa/metal Gate Stacks for CMOS Applications written by Alexander Nichau. This book was released on 2013. Available in PDF, EPUB and Kindle. Book excerpt:

Characterization, Integration and Reliability of HfO 2 and LaLuO 3 High-kappa-metal Gate Stacks for CMOS Applications

2013

Author : Alexander Nichau
Release : 2013
Genre :
Kind : eBook
Book Rating : /5 ( reviews)

GET EBOOK

Book Synopsis Characterization, Integration and Reliability of HfO 2 and LaLuO 3 High-kappa-metal Gate Stacks for CMOS Applications by : Alexander Nichau

Download or read book Characterization, Integration and Reliability of HfO 2 and LaLuO 3 High-kappa-metal Gate Stacks for CMOS Applications written by Alexander Nichau. This book was released on 2013. Available in PDF, EPUB and Kindle. Book excerpt:

Characterization, Integration and Reliability of HfO_1tn2 and LaLuO_1tn3 High-_k63-metal [high-kappa-metal] Gate Stacks for CMOS Applications

2013

Author : Alexander Nichau
Release : 2013
Genre :
Kind : eBook
Book Rating : /5 ( reviews)

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Book Synopsis Characterization, Integration and Reliability of HfO_1tn2 and LaLuO_1tn3 High-_k63-metal [high-kappa-metal] Gate Stacks for CMOS Applications by : Alexander Nichau

Download or read book Characterization, Integration and Reliability of HfO_1tn2 and LaLuO_1tn3 High-_k63-metal [high-kappa-metal] Gate Stacks for CMOS Applications written by Alexander Nichau. This book was released on 2013. Available in PDF, EPUB and Kindle. Book excerpt:

Resistive switching in ZrO2 based metal-oxide-metal structures

2014

Author : Irina Kärkkänen
Release : 2014
Genre :
Kind : eBook
Book Rating : 716/5 ( reviews)

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Book Synopsis Resistive switching in ZrO2 based metal-oxide-metal structures by : Irina Kärkkänen

Download or read book Resistive switching in ZrO2 based metal-oxide-metal structures written by Irina Kärkkänen. This book was released on 2014. Available in PDF, EPUB and Kindle. Book excerpt:

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