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Characterization in Compound Semiconductor Processing

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Release : 2010-01-01
Genre : Technology & Engineering
Kind : eBook
Book Rating : 430/5 ( reviews)

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Book Synopsis Characterization in Compound Semiconductor Processing by : Gary E. McGuire

Download or read book Characterization in Compound Semiconductor Processing written by Gary E. McGuire. This book was released on 2010-01-01. Available in PDF, EPUB and Kindle. Book excerpt: Compound semiconductors such as Gallium Arsenide, Gallium Aluminum Arsenide, and Indium Phosphide are often difficult to characterize and present a variety of challenges from substrate preparation, to epitaxial growth to dielectric film deposition to dopant introduction. This book reviews the common classes of compound semiconductors, their physical, optical and electrical properties and the various types of methods used for characterizing them when analyzing for defects and application problems. The book features: -- Characterization of III-V Thin Films for Electronic and Optical applications -- Characterization of Dielectric Insulating Film layers -- A Special case study on Deep Level Transient Spectroscopy on GaAs -- Concise summaries of major characterization technologies for compound semiconductor materials, including Auger Electron Spectroscopy, Ballistic Electron Emission Microscopy, Energy-Dispersive X-Ray Spectroscopy, Neutron Activation Analysis and Raman Spectroscopy

Characterization in Compound Semiconductor Processing

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Author :
Release : 2010
Genre : Technology & Engineering
Kind : eBook
Book Rating : 414/5 ( reviews)

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Book Synopsis Characterization in Compound Semiconductor Processing by : Yale Strausser

Download or read book Characterization in Compound Semiconductor Processing written by Yale Strausser. This book was released on 2010. Available in PDF, EPUB and Kindle. Book excerpt: "Characterization in Compound Semiconductor Processing is for scientists and engineers working with compound semiconductor materials and devices who are not characterization specialists. Materials and processes typically used in R&D and in the fabrication of GaAs, GaA1As, InP and HgCdTe based devices provide examples of common analytical problems. The book discusses a variety of characterization techniques to provide insight into how each individually, or in combination, might be used in solving problems associated with these materials. The book will help in the selection and application of the appropriate analytical techniques by its coverage of all stages of materials or device processing: substrate preparation, epitaxial growth, dielectric film deposition, contact formation and dopant introduction."--P. [4] of cover.

Handbook of Compound Semiconductors

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Release : 2008-10-19
Genre : Technology & Engineering
Kind : eBook
Book Rating : 143/5 ( reviews)

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Book Synopsis Handbook of Compound Semiconductors by : Paul H. Holloway

Download or read book Handbook of Compound Semiconductors written by Paul H. Holloway. This book was released on 2008-10-19. Available in PDF, EPUB and Kindle. Book excerpt: This book reviews the recent advances and current technologies used to produce microelectronic and optoelectronic devices from compound semiconductors. It provides a complete overview of the technologies necessary to grow bulk single-crystal substrates, grow hetero-or homoepitaxial films, and process advanced devices such as HBT's, QW diode lasers, etc.

Semiconductor Characterization

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Author :
Release : 1996
Genre : Science
Kind : eBook
Book Rating : /5 ( reviews)

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Book Synopsis Semiconductor Characterization by : W. Murray Bullis

Download or read book Semiconductor Characterization written by W. Murray Bullis. This book was released on 1996. Available in PDF, EPUB and Kindle. Book excerpt: Market: Those in government, industry, and academia interested in state-of-the-art knowledge on semiconductor characterization for research, development, and manufacturing. Based on papers given at an International Nist Workshop in January 1995, Semiconductor Characterization covers the unique characterization requirements of both silicon IC development and manufacturing, and compound semiconductor materials, devices, and manufacturing. Additional sections discuss technology trends and future requirements for compound semiconductor applications. Also highlighted are recent developments in characterization, including in- situ, in-FAB, and off-line analysis methods. The book provides a concise, effective portrayal of industry needs and problems in the important specialty of metrology for semiconductor technology.

Vapor Crystal Growth and Characterization

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Release : 2020-01-14
Genre : Technology & Engineering
Kind : eBook
Book Rating : 55X/5 ( reviews)

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Book Synopsis Vapor Crystal Growth and Characterization by : Ching-Hua Su

Download or read book Vapor Crystal Growth and Characterization written by Ching-Hua Su. This book was released on 2020-01-14. Available in PDF, EPUB and Kindle. Book excerpt: The book describes developments in the crystal growth of bulk II-VI semiconductor materials. A fundamental, systematic, and in-depth study of the physical vapor transport (PVT) growth process is the key to producing high-quality single crystals of semiconductors. As such, the book offers a comprehensive overview of the extensive studies on ZnSe and related II-VI wide bandgap compound semiconductors, such as CdS, CdTe, ZnTe, ZnSeTe and ZnSeS. Further, it shows the detailed steps for the growth of bulk crystals enabling optical devices which can operate in the visible spectrum for applications such as blue light emitting diodes, lasers for optical displays and in the mid-IR wavelength range, high density recording, and military communications. The book then discusses the advantages of crystallization from vapor compared to the conventional melt growth: lower processing temperatures, the purification process associated with PVT, and the improved surface morphology of the grown crystals, as well as the necessary drawbacks to the PVT process, such as the low and inconsistent growth rates and the low yield of single crystals. By presenting in-situ measurements of transport rate, partial pressures and interferometry, as well as visual observations, the book provides detailed insights into in the kinetics during the PVT process. This book is intended for graduate students and professionals in materials science as well as engineers preparing and developing optical devices with semiconductors.

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