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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

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Release : 2006-04-11
Genre : Technology & Engineering
Kind : eBook
Book Rating : 146/5 ( reviews)

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Book Synopsis Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis by : Alvin W. Czanderna

Download or read book Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis written by Alvin W. Czanderna. This book was released on 2006-04-11. Available in PDF, EPUB and Kindle. Book excerpt: Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

Methods of Surface Analysis

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Release : 1990-04-12
Genre : Science
Kind : eBook
Book Rating : 906/5 ( reviews)

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Book Synopsis Methods of Surface Analysis by : J. M. Walls

Download or read book Methods of Surface Analysis written by J. M. Walls. This book was released on 1990-04-12. Available in PDF, EPUB and Kindle. Book excerpt:

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

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Release : 2012-10-25
Genre : Science
Kind : eBook
Book Rating : 807/5 ( reviews)

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Book Synopsis Auger- and X-Ray Photoelectron Spectroscopy in Materials Science by : Siegfried Hofmann

Download or read book Auger- and X-Ray Photoelectron Spectroscopy in Materials Science written by Siegfried Hofmann. This book was released on 2012-10-25. Available in PDF, EPUB and Kindle. Book excerpt: To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

Proceedings of the 10th International Conference on Metrology and Properties of Engineering Surfaces

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Release : 2005
Genre :
Kind : eBook
Book Rating : 891/5 ( reviews)

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Book Synopsis Proceedings of the 10th International Conference on Metrology and Properties of Engineering Surfaces by : Tom R. Thomas

Download or read book Proceedings of the 10th International Conference on Metrology and Properties of Engineering Surfaces written by Tom R. Thomas. This book was released on 2005. Available in PDF, EPUB and Kindle. Book excerpt:

4M 2005 - First International Conference on Multi-Material Micro Manufacture

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Release : 2005-12-07
Genre : Technology & Engineering
Kind : eBook
Book Rating : 553/5 ( reviews)

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Book Synopsis 4M 2005 - First International Conference on Multi-Material Micro Manufacture by : Stefan Dimov

Download or read book 4M 2005 - First International Conference on Multi-Material Micro Manufacture written by Stefan Dimov. This book was released on 2005-12-07. Available in PDF, EPUB and Kindle. Book excerpt: 4M 2005 - First International Conference on Multi-Material Micro Manufacture

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