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An Introduction to Logic Circuit Testing

2022-06-01 Technology & Engineering
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Release : 2022-06-01
Genre : Technology & Engineering
Kind : eBook
Book Rating : 85X/5 ( reviews)

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Book Synopsis An Introduction to Logic Circuit Testing by : Parag K. Lala

Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala. This book was released on 2022-06-01. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Digital Logic Testing and Simulation

1985-12
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Release : 1985-12
Genre :
Kind : eBook
Book Rating : 228/5 ( reviews)

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Book Synopsis Digital Logic Testing and Simulation by : Alexander Miczo

Download or read book Digital Logic Testing and Simulation written by Alexander Miczo. This book was released on 1985-12. Available in PDF, EPUB and Kindle. Book excerpt: The new standard in the field, presenting the latest design and testing methods for logic circuits, and the development of a BASIC-based simulation. Offers designers and test engineers unique coverage of circuit design for testability, stressing the incorporation of hardware into designs that facilitate testing and diagnosis by allowing greater access to internal circuits. Examines various ways of representing a design, as well as external testing methods that apply this information.

Digital Logic Testing and Simulation

2003-10-24 Technology & Engineering
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Release : 2003-10-24
Genre : Technology & Engineering
Kind : eBook
Book Rating : 779/5 ( reviews)

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Book Synopsis Digital Logic Testing and Simulation by : Alexander Miczo

Download or read book Digital Logic Testing and Simulation written by Alexander Miczo. This book was released on 2003-10-24. Available in PDF, EPUB and Kindle. Book excerpt: Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.

Logic Testing and Design for Testability

1985-06-01 Business & Economics
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Release : 1985-06-01
Genre : Business & Economics
Kind : eBook
Book Rating : 990/5 ( reviews)

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Book Synopsis Logic Testing and Design for Testability by : Hideo Fujiwara

Download or read book Logic Testing and Design for Testability written by Hideo Fujiwara. This book was released on 1985-06-01. Available in PDF, EPUB and Kindle. Book excerpt: Today's computers must perform with increasing reliability, which in turn depends onthe problem of determining whether a circuit has been manufactured properly or behaves correctly.However, the greater circuit density of VLSI circuits and systems has made testing more difficultand costly. This book notes that one solution is to develop faster and more efficient algorithms togenerate test patterns or use design techniques to enhance testability - that is, "design fortestability." Design for testability techniques offer one approach toward alleviating this situationby adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. Becausethe cost of hardware is decreasing as the cost of testing rises, there is now a growing interest inthese techniques for VLSI circuits.The first half of the book focuses on the problem of testing:test generation, fault simulation, and complexity of testing. The second half takes up the problemof design for testability: design techniques to minimize test application and/or test generationcost, scan design for sequential logic circuits, compact testing, built-in testing, and variousdesign techniques for testable systems.Hideo Fujiwara is an associate professor in the Department ofElectronics and Communication, Meiji University. Logic Testing and Design for Testability isincluded in the Computer Systems Series, edited by Herb Schwetman.

Digital Logic Testing and Testability

1991
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Release : 1991
Genre :
Kind : eBook
Book Rating : /5 ( reviews)

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Book Synopsis Digital Logic Testing and Testability by : Warren H. Debany (Jr)

Download or read book Digital Logic Testing and Testability written by Warren H. Debany (Jr). This book was released on 1991. Available in PDF, EPUB and Kindle. Book excerpt:

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