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Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

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Release : 2011
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Kind : eBook
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Book Synopsis Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy by :

Download or read book Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy written by . This book was released on 2011. Available in PDF, EPUB and Kindle. Book excerpt:

Defects at Oxide Surfaces

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Release : 2015-02-09
Genre : Science
Kind : eBook
Book Rating : 670/5 ( reviews)

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Book Synopsis Defects at Oxide Surfaces by : Jacques Jupille

Download or read book Defects at Oxide Surfaces written by Jacques Jupille. This book was released on 2015-02-09. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the basics and characterization of defects at oxide surfaces. It provides a state-of-the-art review of the field, containing information to the various types of surface defects, describes analytical methods to study defects, their chemical activity and the catalytic reactivity of oxides. Numerical simulations of defective structures complete the picture developed. Defects on planar surfaces form the focus of much of the book, although the investigation of powder samples also form an important part. The experimental study of planar surfaces opens the possibility of applying the large armoury of techniques that have been developed over the last half-century to study surfaces in ultra-high vacuum. This enables the acquisition of atomic level data under well-controlled conditions, providing a stringent test of theoretical methods. The latter can then be more reliably applied to systems such as nanoparticles for which accurate methods of characterization of structure and electronic properties have yet to be developed. The book gives guidance to tailor oxide surfaces by controlling the nature and concentration of defects. The importance of defects in the physics and chemistry of metal oxide surfaces is presented in this book together with the prominent role of oxides in common life. The book contains contributions from leaders in the field. It serves as a reference for experts and beginners in the field.

Scanning Tunneling Microscopy in Surface Science, Nanoscience, and Catalysis

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Release : 2009-11-11
Genre : Science
Kind : eBook
Book Rating : 834/5 ( reviews)

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Book Synopsis Scanning Tunneling Microscopy in Surface Science, Nanoscience, and Catalysis by : Michael Bowker

Download or read book Scanning Tunneling Microscopy in Surface Science, Nanoscience, and Catalysis written by Michael Bowker. This book was released on 2009-11-11. Available in PDF, EPUB and Kindle. Book excerpt: Here, top international authors in the field of STM and surface science present first-class contributions on this hot topic, bringing the reader up to date with the latest developments in this rapidly advancing field. The focus is on the nanoscale, particularly in relation to catalysis, involving developments in our understanding of the nature of the surfaces of oxides and nanoparticulate materials, as well as adsorption, and includes in-situ studies of catalysis on such model materials. Of high interest to practitioners of surface science, nanoscience, STM and catalysis.

Scanning Tunneling Microscopy

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Release : 2012-12-06
Genre : Science
Kind : eBook
Book Rating : 124/5 ( reviews)

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Book Synopsis Scanning Tunneling Microscopy by : H. Neddermeyer

Download or read book Scanning Tunneling Microscopy written by H. Neddermeyer. This book was released on 2012-12-06. Available in PDF, EPUB and Kindle. Book excerpt: The publication entitled "Surface Studies by Scanning Tunneling Mi Rl croscopy" by Binnig, Rohrer, Gerber and Weibel of the IBM Research Lab oratory in Riischlikon in 1982 immediately raised considerable interest in the sur face science community. It was demonstrated in Reference R1 that images from atomic structures of surfaces like individual steps could be obtained simply by scanning the surface with a sharp metal tip, which was kept in a constant distance of approximately 10 A from the sample surface. The distance control in scanning tunneling microscopy (STM) was realized by a feedback circuit, where the electri cal tunneling current through the potential barrier between tip and sample is used for regulating the tip position with a piezoelectric xyz-system. A similar experi mental approach has already been described by Young et al. for the determination l of the macroscopic roughness of a surface. A number of experimental difficulties had to be solved by the IBM group until this conceptual simple microscopic method could be applied successfully with atomic resolution. Firstly, distance and scanning control of the tip have to be operated with sufficient precision to be sensitive to atomic structures. Secondly, sample holder and tunneling unit have to be designed in such a way that external vibrations do not influence the sample-tip distance and that thermal or other drift effects become small enough during measurement of one image.

Scanning Tunneling Microscopy and Spectroscopy

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Release : 1993-03-29
Genre : Science
Kind : eBook
Book Rating : 356/5 ( reviews)

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Book Synopsis Scanning Tunneling Microscopy and Spectroscopy by : Dawn Bonnell

Download or read book Scanning Tunneling Microscopy and Spectroscopy written by Dawn Bonnell. This book was released on 1993-03-29. Available in PDF, EPUB and Kindle. Book excerpt: Scanning tunneling microscopy (STM) provides three-dimensional real- space images of surfaces at high spatial resolution. When the surface is flat and clean, even atoms can be imaged. Its extreme usefulness has led it to near instantaneous acceptance as a characterization tool. This book covers fundamental concepts of STM operation, image interpretation, instrumentation, and techniques for various applications. It als contains advanced treatments of theory and spectroscopy. Surface physicists, electrochemists, materials scientists, and other scientists who see a use for STM will find the depth of coverage and accompanying reference lists in this book essential to their work. In addition, those who wish to add the capabilities of probe microscopy to their operations, such as microscopists and quality control engineers, will find the basic information in this book.

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